Fraunhofer Institute for Manufacturing Technology and Advanced Materials IFAM
Fraunhofer Institute for Manufacturing Technology and Advanced Materials IFAM
Microscopic view of molecules connecting in a complex network
© AdobeStock/Mohammed (generated with KI)
Microscopic view of molecules connecting in a complex network. A detailed 3D rendering showcases intricate bonds and structures.

© AdobeStock/Mohammed (generated with KI)

Surface Analytics

Understanding and Optimizing Interfaces

SEM image of a paint defect
© Fraunhofer IFAM
SEM image of a paint defect

Surface and interface properties play a crucial role in the quality and performance of numerous products and industrial processes. Even the slightest contamination can affect coating and manufacturing processes, compromising their functionality. This applies to applications such as adhesive bonding, painting, printing, and metallization.

Fraunhofer IFAM offers a wide range of analytical methods for comprehensive chemical and structural surface analysis at the nanoscale.

Our extensive expertise in industrial research allows us to address the following key questions:

  • Adhesion of coatings (e.g., paints, printing inks, metallizations, plasma coatings) or adhesives
  • Wettability issues
  • Film-like and particulate contamination on surfaces or within materials
  • Aging behavior of composite materials
  • Efficacy of cleaning processes and surface treatments (laser, primers, etc.)

Our goal is to transfer findings into practical applications and tailor investigations to individual requirements. By closely collaborating with in-house surface technology experts, we ensure that your questions are handled with competence.

 

Our Analytical Capabilities include:

X-ray Photoelectron Spectroscopy (XPS)

Analysing surface chemistry using X-ray photoelectron spectroscopy (XPS)
© Fraunhofer IFAM
Analysing surface chemistry using X-ray photoelectron spectroscopy (XPS)

Analysing the quantitative elemental composition of surfaces

  • Determination of element concentrations
  • Analysis of oxidation states
  • Information depth <10 nm, sputter depth profiling possible
  • Measuring spot size: approx. 100-500 μm
  • Resolution in imaging mode up to 5 μm possible

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

ToF-SIMS analysis of salt-like deposits on the surface of a mould for the plastic injection moulding of polycarbonate optics.
© Fraunhofer IFAM
ToF-SIMS analysis of salt-like deposits on the surface of a mould for the plastic injection moulding of polycarbonate optics.

Analysing the molecular composition of surfaces

  • Identification of contaminants, additives, fatty acid compounds, trace elements, etc.
  • Measuring spot size: at least 500 μm with 3 µm resolution at the same time, up to 50 nm resolution possible
  • Depth profiling possible

IR Spectroscopy & Microscopy (various methods)

nanoIR analysis (PiFM) of a niO atmospheric pressure plasma coating
© Fraunhofer IFAM
nanoIR analysis (PiFM) of a niO atmospheric pressure plasma coating

Characterisation and identification of organic / inorganic materials, in some cases with the highest resolution and surface sensitivity

  • Various state-of-the-art FTIR methods and confocal Raman microscopy
  • Laser-based IR microscopy for higher sensitivities and larger measuring ranges (Bruker Hyperion II QCL)
  • PiFM from Molecular Vista: IR spectra and distribution images with AFM-typical resolution (<10 nm lateral resolution) and highest surface sensitivity (<50 nm information depth)

Atomic Force Microscopy (AFM)

AFM analysis of the electrode structure of an ultracapacitor
© Fraunhofer IFAM
AFM analysis of the electrode structure of an ultracapacitor. The image on the left shows the roughness in the surface of the aluminium foil. On the right are some insufficiently electrically contacted carbon particles.

Analysing the topography and various material properties on the nanoscale

  • Parallel recording of e module, adhesion, current, voltage, etc.
  • Roughness analysis
  • PiFM from Molecular Vista: IR spectra and distribution images (see above)
  • Measuring range size up to approx. 80 μm

Scanning and Transmission Electron Microscopy (SEM, TEM)

SEM analysis of a cross-section of a plastic metallisation with excessive roughness
© Fraunhofer IFAM
SEM analysis of a cross-section of a plastic metallisation with excessive roughness

Atomic imaging and element analyses using scanning and transmission electron microscopy

  • Characterisation of material and topography contrasts on surfaces and cross-sections
  • Preparation of cross-sections and TEM lamellae using various methods, in particular FIB and ultramicrotomy
  • Imaging and material analysis of particulate and sometimes filmic contamination, corrosion structures, layer defects, etc.
  • High-resolution imaging down to atomic resolution (2.4Å)
  • Determination of elemental compositions (EDX, EFTEM, EELS)
  • Electron tomography with a resolution of up to 1-2 nm

Additionally, we have access to further specialized methods through our extensive network within and beyond Fraunhofer. Especially in complex research and development projects, you benefit from an integrated approach that provides all analyses from a single source.

Feel free to contact us – we will find the optimal solution for your analytical challenge!